Abstract
Subplantation of the noble-gas ions , , , and into graphite in the energy range of 10–150 eV with doses in the range of 1–15× ions/ has been studied by Auger electron spectroscopy (AES) and computer simulations. A technique based on AES line-shape analysis has been employed to describe quantitatively the ion-induced damage to the lattice. The carbon KLL AES line shapes and the AES spectra from subplanted Ne, Ar, and Kr were used to determine the ion penetration thresholds , ion displacement thresholds , and the lattice displacement energies . The ’s scale linearly with the atomic radius of the projectiles. Defect production begins at , although these energies are below . A mechanism for defect production at energies below based on noble-gas interstitials and lattice strain and distortion is developed. This process is modeled through the charmm molecular modeling program and the trim classical trajectory simulation.
- Received 1 March 1993
DOI:https://doi.org/10.1103/PhysRevB.48.6757
©1993 American Physical Society