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Coalescence and percolation in thin metal films

X. Yu, P. M. Duxbury, G. Jeffers, and M. A. Dubson
Phys. Rev. B 44, 13163(R) – Published 15 December 1991
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Abstract

Metals thermally evaporated onto warm insulating substrates evolve to the thin-film state via the morphological sequence: compact islands, elongated islands, percolation, hole filling, and finally the thin-film state. The coverage at which the metal percolates (pc) is often considerably higher than that predicted by percolation models, such as inverse swiss cheese or lattice percolation. Using a simple continuum model, we show that high-pc’s arise naturally in thin films that exhibit a crossover from full coalescence of islands at early stages of growth to partial coalescence at later stages. In this interrupted-coalescence model, full coalescence of islands occurs up to a critical island radius Rc, after which islands overlap, but do not fully coalesce. We present the morphology of films and the critical area coverages generated by this model.

  • Received 17 September 1991

DOI:https://doi.org/10.1103/PhysRevB.44.13163

©1991 American Physical Society

Authors & Affiliations

X. Yu, P. M. Duxbury, G. Jeffers, and M. A. Dubson

  • Department of Physics and Astronomy and Center for Fundamental Materials Research, Michigan State University, East Lansing, Michigan 48824-1116

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Issue

Vol. 44, Iss. 23 — 15 December 1991

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