Mid-infrared reflectivity and ellipsometry measurements on single-crystal YBa2Cu3O7 and Bi2Sr2CuO6+y

Yukio Watanabe, Z. Z. Wang, S. A. Lyon, D. C. Tsui, N. P. Ong, J. M. Tarascon, and P. Barboux
Phys. Rev. B 40, 6884 – Published 1 October 1989
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Abstract

We have measured the room-temperature reflectivity of ‘‘90-K’’ single crystals YBa2Cu3O7 in the frequency range 600–9000 cm1. The reflectivity R in these highly conducting samples (ρab=150 μΩ cm at 290 K) is found to be higher than in previous reports. We fit R to a simple Drude-Lorentz model and compare the fit parameters with the dc transport values. (The effective-mass ratio of the carriers is found to be 2.0, and the scattering rate ħ/τ is 3.1kBT at room temperature.) Ellipsometry measurements have also been performed using transverse-electric and transverse-magnetic polarizations. The dielectric dispersion derived from ellipsometry shows some important deviations from the Drude-Lorentz model. Reflectivity data from nonsuperconducting crystals of Bi2Sr2CuO6+y are also reported.

  • Received 1 May 1989

DOI:https://doi.org/10.1103/PhysRevB.40.6884

©1989 American Physical Society

Authors & Affiliations

Yukio Watanabe

  • Department of Electrical Engineering, Princeton University, Princeton, New Jersey 08544

Z. Z. Wang

  • Department of Physics, Princeton University, Princeton, New Jersey 08544

S. A. Lyon

  • Department of Electrical Engineering, Princeton University, Princeton, New Jersey 08544

D. C. Tsui

  • Department of Electrical Engineering and Department of Physics, Princeton University, Princeton, New Jersey 08544

N. P. Ong

  • Department of Physics, Princeton University, Princeton, New Jersey 08544

J. M. Tarascon and P. Barboux

  • Bell Communications Research, Red Bank, New Jersey 07701

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Vol. 40, Iss. 10 — 1 October 1989

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