Combined extended x-ray-absorption fine structure and diffraction study of Kr adsorbed on graphite

Christopher A. Guryan, Ki Bong Lee, Peter W. Stephens, Alan I. Goldman, John Z. Larese, Paul A. Heiney, and Ernest Fontes
Phys. Rev. B 37, 3461 – Published 1 March 1988
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Abstract

We report the results of a combined extended x-ray-absorption fine structure (EXAFS) and x-ray diffraction study of Kr adsorbed on a ZYX graphite substrate. The data are consistent with simple models for atomic fluctuations, which are found to be surprisingly large. Thermal fluctuations weaken the Kr-Kr EXAFS signal, so that the average number of Kr neighbors and the EXAFS Debye-Waller factor cannot be determined independently. The disordered phase at the commensurate-incommensurate transition appears to have substantial local order in the Kr-C signal, consistent with the domain-wall description of that phase.

  • Received 11 March 1987

DOI:https://doi.org/10.1103/PhysRevB.37.3461

©1988 American Physical Society

Authors & Affiliations

Christopher A. Guryan, Ki Bong Lee, and Peter W. Stephens

  • State University of New York at Stony Brook, Stony Brook, New York 11794-3800

Alan I. Goldman and John Z. Larese

  • Department of Physics, Brookhaven National Laboratory, Upton, New York 11973-5000

Paul A. Heiney and Ernest Fontes

  • Department of Physics and Laboratory for Research on the Structure of Matter, University of Pennsylvania, Philadelphia, Pennsylvania 19104

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Issue

Vol. 37, Iss. 7 — 1 March 1988

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