Temperature dependence of the dielectric function and the interband critical points of InSb

S. Logothetidis, L. Via, and M. Cardona
Phys. Rev. B 31, 947 – Published 15 January 1985
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Abstract

Measurements performed with a rotating-analyzer ellipsometer have been used to determine the dielectric function of undoped InSb between 1.2 and 5.6 eV in the temperature range 100 to 700 K. The critical energies of the critical points (CP’s) E1, E1+Δ1, E0, E0+Δ0, E2, Δ5vu-Δ5cu, Δ5vl-Δ5cu, E1, and E1+Δ1, and their dependence on temperature, have been obtained. Separate critical contributions in the E0 region, which were assigned earlier to Γ- and Δ-symmetry transitions, have been resolved. The experimentally obtained CP energies have been fitted to the empirical expression given by Varshni and also to a phenomenological expression which follows from the Bose-Einstein statistical factor. The line-shape analysis of the derivative spectra allows us to obtain precise broadening parameters, amplitudes, and excitonic phase angles for the above-mentioned CP’s. A decrease in these phase angles with increasing temperature is observed. It suggests a corresponding decrease of excitonic interaction effects with increasing temperature.

  • Received 27 July 1984

DOI:https://doi.org/10.1103/PhysRevB.31.947

©1985 American Physical Society

Authors & Affiliations

S. Logothetidis, L. Via, and M. Cardona

  • Max-Planck-Institut für Festkörperforschung, Heisenbergstrasse 1, D-7000 Stuttgart 80, Federal Republic of Germany

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Vol. 31, Iss. 2 — 15 January 1985

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