Quantitative analysis of free-electron dynamics in InSb by terahertz shockwave spectroscopy

Peter Fischer, Gabriel Fitzky, Davide Bossini, Alfred Leitenstorfer, and Ron Tenne
Phys. Rev. B 106, 205201 – Published 7 November 2022

Abstract

The contribution of free electrons to the dielectric function is largely determined by their plasmonic resonance, a collective density oscillation. We studied this broadband and carrier-density-dependent response in the narrow-gap semiconductor InSb with THz shockwave spectroscopy. A synthesized waveform, with a steep onset followed by a short electric-field plateau, gives access to a multioctave spectrum of frequencies from 100 GHz up to the mid infrared. By measuring the entire spectral characteristics of the plasma, we analyze the dynamics of photogenerated free electrons for a wide range of excitation fluences. Thanks to this analysis, we were able to quantify the coefficients of both electron trapping and the Auger process from cryogenic to room temperature.

  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
3 More
  • Received 11 April 2022
  • Revised 5 October 2022
  • Accepted 12 October 2022

DOI:https://doi.org/10.1103/PhysRevB.106.205201

©2022 American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied Physics

Authors & Affiliations

Peter Fischer, Gabriel Fitzky, Davide Bossini, Alfred Leitenstorfer, and Ron Tenne*

  • Department of Physics and Center for Applied Photonics, University of Konstanz, D-78457 Konstanz, Germany

  • *ron.tenne@uni-konstanz.de

Article Text (Subscription Required)

Click to Expand

References (Subscription Required)

Click to Expand
Issue

Vol. 106, Iss. 20 — 15 November 2022

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review B

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×