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Nanometric resolution using far-field optical tomographic microscopy in the multiple scattering regime

Jules Girard, Guillaume Maire, Hugues Giovannini, Anne Talneau, Kamal Belkebir, Patrick C. Chaumet, and Anne Sentenac
Phys. Rev. A 82, 061801(R) – Published 10 December 2010

Abstract

The resolution of optical far-field microscopes is classically diffraction-limited to half the illumination wavelength. We show experimentally that this fundamental limit does not apply in the multiple scattering regime. We used tomographic diffractive microscopy at 633 nm to image two pairs of closely spaced rods (with a width and interdistance of 50 nm) of widely different diffractive properties. Using an inversion algorithm accounting for multiple scattering, only the pair of highly diffracting rods could be clearly visualized with a resolution similar to that of an atomic force microscope.

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  • Received 30 July 2010

DOI:https://doi.org/10.1103/PhysRevA.82.061801

© 2010 The American Physical Society

Authors & Affiliations

Jules Girard1, Guillaume Maire1, Hugues Giovannini1, Anne Talneau2, Kamal Belkebir1, Patrick C. Chaumet1, and Anne Sentenac1

  • 1Institut Fresnel (CNRS UMR 6133), Aix-Marseille Université, F-13013 Marseille, France
  • 2CNRS, Lab Photon & Nanostruct, F-91460 Marcoussis, France

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Issue

Vol. 82, Iss. 6 — December 2010

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