Algorithm for preparation of multilayer systems with high critical angle of total reflection

I. Carron and V. Ignatovich
Phys. Rev. A 67, 043610 – Published 22 April 2003
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Abstract

A development of the theory of multilayer systems is presented. It shows precisely how to calculate thicknesses and number of layers to get reflectivity close to unity for a given arbitrary critical angle. Application of the proposed approach to real systems is demonstrated.

  • Received 6 December 2002

DOI:https://doi.org/10.1103/PhysRevA.67.043610

©2003 American Physical Society

Authors & Affiliations

I. Carron

  • CSCE, Texas A&M University, College Station, Texas 77843

V. Ignatovich

  • FLNP JINR, Dubna Moscow Region, 141980, Russia

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Issue

Vol. 67, Iss. 4 — April 2003

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