Phase-Matched Critical Total Reflection and the Goos-Haenchen Shift in Second-Harmonic Generation

H. Shih and N. Bloembergen
Phys. Rev. A 3, 412 – Published 1 January 1971
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Abstract

It is well established that a totally reflected light beam of finite diameter undergoes a lateral displacement, known as the Goos-Haenchen shift. The theory for the corresponding effect in nonlinear optics is presented. The special phase-matched case, in which both the fundamental and the second harmonic are at critical total reflection, is shown to have a characteristic radiation pattern. Since the finite beam diameter is taken into account, divergencies of earlier theories are eliminated.

  • Received 12 August 1970

DOI:https://doi.org/10.1103/PhysRevA.3.412

©1971 American Physical Society

Authors & Affiliations

H. Shih and N. Bloembergen*

  • Division of Engineering and Applied Physics, Harvard University, Cambridge, Massachusetts 02138

  • *Vinson Hayes Senior Fellow.

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Vol. 3, Iss. 1 — January 1971

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