Percolation in Heavily Doped Semiconductors

D. F. Holcomb and J. J. Rehr, Jr
Phys. Rev. 183, 773 – Published 15 July 1969
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Abstract

Determination of the detailed nature of the semiconductor-to-metal transition in doped semiconductors is obscured by the random placement of the impurities. We report the results of a Monte Carlo percolation calculation which show that the details of the Hall-coefficient data in Si:P and, less clearly, in Ge:Sb are consistent with the existence of a discontinuous transition from insulator to metal at T=0K as the impurity concentration is increased.

  • Received 3 February 1969

DOI:https://doi.org/10.1103/PhysRev.183.773

©1969 American Physical Society

Authors & Affiliations

D. F. Holcomb* and J. J. Rehr, Jr

  • Laboratory of Atomic and Solid State Physics, Cornell University, Ithaca, New York 14850

  • *Address during 1968-69 academic year: Physics Laboratory, University of Kent, Canterbury, England.
  • NSF Graduate Fellow, 1967-69.

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Issue

Vol. 183, Iss. 3 — July 1969

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