Isoelectronic Traps Due to Nitrogen in Gallium Phosphide

D. G. Thomas and J. J. Hopfield
Phys. Rev. 150, 680 – Published 14 October 1966
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Abstract

Several sharp lines are seen in absorption and fluorescence in crystals of gallium phosphide containing nitrogen as an isolectronic substituent for phosphorus. These lines fall within about 0.15 eV of the band-gap energy. The most prominent line, the A line, is due to a hole and an electron bound to an isolated nitrogen atom. A deeper series of lines, the NN lines, are due to pairs of nitrogen atoms, each line corresponding to a particular internuclear pair separation. This follows from the observation that the NN-center concentrations vary as the square of the A-center concentration. The Zeeman patterns of the lines and several other pieces of evidence indicate that the deepest NN line corresponds to closest-neighbor nitrogen pairs, the second deepest to second-neighbor pairs, and so on. Vibrational sidebands can be seen in fluorescence included among which are local-mode frequencies. The substitution of N15 for N14 caused these local modes to shift in exact accord with theoretical expectations. A brief qualitative discussion of the nature of isoelectronic traps in semiconductors is presented.

  • Received 18 April 1966

DOI:https://doi.org/10.1103/PhysRev.150.680

©1966 American Physical Society

Authors & Affiliations

D. G. Thomas

  • Bell Telephone Laboratories, Murray Hill, New Jersey

J. J. Hopfield

  • Palmer Physical Laboratory, Princeton University, Princeton, New Jersey

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Issue

Vol. 150, Iss. 2 — October 1966

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