Abstract
The article presents some results of fractal analysis of ferroelectric domain structure images visualized with scanning electron microscope (SEM) techniques. The fractal and multifractal characteristics were estimated to demonstrate self-similar organization of ferroelectric domain structure registered with static and dynamic contrast modes of SEM. Fractal methods as sensitive analytical tools were used to indicate degree of domain structure and domain boundary imperfections. The electron irradiation-induced erosion effect of ferroelectric domain boundaries in electron beam-stimulated polarization current mode of SEM is characterized by considerable raising of fractal dimension. For dynamic contrast mode of SEM there was revealed that complication of domain structure during its dynamics is specified by increase in fractal dimension of images and slight raising of boundary fractal dimension.
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