THGEM electron multiplier in high pressure Kr

, , and

Published 19 October 2009 Published under licence by IOP Publishing Ltd
, , Citation J M Maia et al 2009 JINST 4 P10006 DOI 10.1088/1748-0221/4/10/P10006

1748-0221/4/10/P10006

Abstract

The properties of the THick Gas Electron Multiplier (THGEM) operated with soft X-rays in Kr at room temperature, are presented. Charge gains ranging from 104 to 3 × 102 and from 4 × 104 to 103 were reached with single- and double-THGEM detectors in a pressure range of 0.5–3.0 bar, respectively, for operation voltages in the range of 800–2600 V. The gain was limited by photon- and ion-feedback effects, and by electron field-emission from the Cu-electrodes at THGEM operation voltages above 2000 V. Energy resolutions in the range of 21–34% FWHM were measured with 5.9 keV X-rays. Other characteristics, including pulse-shape and electric fields in THGEM structures, are discussed.

Export citation and abstract BibTeX RIS

10.1088/1748-0221/4/10/P10006