XANES spectroscopy using high-resolution resonant Raman scattering: application to holmium

The use of resonant Raman scattering at X-ray energies for studies of the near-edge structure of the absorption edge is presented. The potential of the method is shown in the case of the Ho L_III-edge, which is measured using Cu K alpha 1 radiation and a focusing crystal spectrometer. The results are interpreted within a model where the density of final electron states is constant plus a narrow band where the density is high (white line). A comparison with the other methods used in X-ray absorption near-edge structure spectroscopy is also given.