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Thermal and molecular stresses in multi-layered structures of nitride devices
M Dems and W Nakwaski
Published under licence by IOP Publishing Ltd
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Citation M Dems and W Nakwaski 2004 Semicond. Sci. Technol. 19 667
DOI 10.1088/0268-1242/19/5/C01
This is a correction for 2003 Semicond. Sci. Technol. 18 733
0268-1242/19/5/667