A new low‐energy electron diffraction (LEED) system has been constructed with a pulse counting position sensitive detector using channel plates and a wedge and strip anode. The detector accepts diffracted electrons over a 120° angle and the LEED pattern is recorded as a 256×256 pixel image. Individual LEED spot intensities can be measured up to a maximum linear count rate of ∼5 kHz while the dark count rate is ∼0.02 Hz, yielding a dynamic range greater than 105. Incident beam currents for LEED measurements are ∼1 pA. Diffuse LEED intensities from disordered systems can be measured using the large dynamic range of this instrument. Examples of diffuse LEED measurements are presented. The low incident beam currents also allow for LEED intensity‐voltage measurements on surfaces sensitive to electron beam damage and on nonconducting surfaces.
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January 1992
Research Article|
January 01 1992
A new pulse counting low‐energy electron diffraction system based on a position sensitive detector
D. Frank Ogletree;
D. Frank Ogletree
Center for Advanced Materials, Materials Sciences Division, Lawrence Berkeley Laboratory, 1 Cyclotron Road, Berkeley, California 94720
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G. S. Blackman;
G. S. Blackman
Center for Advanced Materials, Materials Sciences Division, Lawrence Berkeley Laboratory, 1 Cyclotron Road, Berkeley, California 94720
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R. Q. Hwang;
R. Q. Hwang
Center for Advanced Materials, Materials Sciences Division, Lawrence Berkeley Laboratory, 1 Cyclotron Road, Berkeley, California 94720
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U. Starke;
U. Starke
Center for Advanced Materials, Materials Sciences Division, Lawrence Berkeley Laboratory, 1 Cyclotron Road, Berkeley, California 94720
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G. A. Somorjai;
G. A. Somorjai
Center for Advanced Materials, Materials Sciences Division, Lawrence Berkeley Laboratory, 1 Cyclotron Road, Berkeley, California 94720
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J. E. Katz
J. E. Katz
Engineering Division, Lawrence Berkeley Laboratory, 1 Cyclotron Road, Berkeley, California 94720
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Rev. Sci. Instrum. 63, 104–113 (1992)
Article history
Received:
May 16 1991
Accepted:
October 14 1991
Citation
D. Frank Ogletree, G. S. Blackman, R. Q. Hwang, U. Starke, G. A. Somorjai, J. E. Katz; A new pulse counting low‐energy electron diffraction system based on a position sensitive detector. Rev. Sci. Instrum. 1 January 1992; 63 (1): 104–113. https://doi.org/10.1063/1.1143196
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