Antisite defects in layered multiferroic CuCr0.9In0.1P2S6

Qian He; Alex Belianinov; Andrius Dziaugys; Petro Maksymovych; Yulian Vysochanskii; Sergei V. Kalinin; Albina Y. Borisevich

doi:10.1039/C5NR04779J

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Antisite defects in layered multiferroic CuCr_0.9In_0.1P₂S₆†

Qian He,*^a Alex Belianinov,^b Andrius Dziaugys,^c Petro Maksymovych,^b Yulian Vysochanskii,^d Sergei V. Kalinin^b and Albina Y. Borisevich*^ab

Author affiliations

* Corresponding authors

^a Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee, USA
E-mail: heqian.lehigh@gmail.com, albinab@ornl.gov

^b The Institute for Functional Imaging of Materials and the Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee, USA

^c Department of Radiophysics, Faculty of Physics, Vilnius University, Lithuania

^d Institute of Solid State Physics and Chemistry, Uzhgorod University, Uzhgorod, Ukraine 88000

Abstract

The CuCr_1−xIn_xP₂S₆ system represents a large family of metal chalcogenophosphates that are unique and promising candidates for 2D materials with functionalities such as ferroelectricity. In this work, we carried out detailed microstructural and chemical characterization of these compounds using aberration-corrected STEM, in order to understand the origin of these different ordering phenomena. Quantitative STEM-HAADF imaging and analysis identified the stacking order of an 8-layer thin flake, which leads to the identification of anti-site In³⁺(Cu⁺) doping. We believe that these findings will pave the way towards understanding the ferroic coupling phenomena in van der Waals lamellar compounds, as well as their potential applications in 2-D electronics.

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Article information

DOI: https://doi.org/10.1039/C5NR04779J
Article type: Paper
Submitted: 16 Jul 2015
Accepted: 30 Sep 2015
First published: 06 Oct 2015

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Nanoscale, 2015,7, 18579-18583

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Antisite defects in layered multiferroic CuCr_0.9In_0.1P₂S₆

Q. He, A. Belianinov, A. Dziaugys, P. Maksymovych, Y. Vysochanskii, S. V. Kalinin and A. Y. Borisevich, Nanoscale, 2015, 7, 18579 DOI: 10.1039/C5NR04779J

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