Issue 10, 2012

Fast measurement of binding kinetics with dual slope SPR microchips

Abstract

We demonstrate a new dual slope SPR technique that is ten-fold faster than the conventional step-response method. The new scheme utilizes rapid slope-based measurements followed by rapid reset, and it separates association and dissociation half reaction measurements at two separate sites inside a dual-chamber PDMS microfluidic chip. For a model CAII-ABS test system, the association and dissociation slopes were measured in 30 seconds compared to 5 minutes for step-response. The values of ka and kd calculated from the slope method are 3.66 ± 0.19 × 103 M−1 s−1 and 4.83 ± 0.17 × 10−2 s−1, respectively, matching well with step-response values while facilitating ∼10 to 15 fold faster detection and quantification.

Graphical abstract: Fast measurement of binding kinetics with dual slope SPR microchips

Article information

Article type
Paper
Submitted
10 Jan 2012
Accepted
07 Mar 2012
First published
11 Apr 2012

Analyst, 2012,137, 2381-2385

Fast measurement of binding kinetics with dual slope SPR microchips

T. Ghosh and C. H. Mastrangelo, Analyst, 2012, 137, 2381 DOI: 10.1039/C2AN35045A

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