Issue 21, 2011
From the journal:

Soft Matter

Structural characterization of the Fddd phase in a diblock copolymer thin film by electron microtomography†

Jueun Jung,a   Hae-Woong Park,a   Junyoung Lee,a   Haiying Huang,a   Taihyun Chang,*a   Yecheol Rho,a   Moonhor Ree,a   Hidekazu Sugimorib  and  Hiroshi Jinnaic  

* Corresponding authors

a Department of Chemistry and Division of Advanced Materials Science, Pohang University of Science and Technology (POSTECH), Pohang, Korea
E-mail: tc@postech.ac.kr
Fax: +82-54-279-3399
Tel: +82-54-279-2109

b Department of Macromolecular Science and Engineering, Graduate School of Science and Engineering, Kyoto Institute of Technology, Kyoto, Japan

c Japan Science and Technology Agency, ERATO, Takahara Soft Interfaces Project and Institute for Materials Chemistry and Engineering (IMCE), CE80, Kyushu University, 744 Motooka, Nishi-ku, Fukuoka, Japan

Abstract

A 3-dimensional Fddd network structure of a polystyrene-block-polyisoprene (PS-b-PI) diblock copolymer (Mn = 31 500, fPI = 0.645) was observed for the first time in real space by transmission electron microtomography (TEMT). In a 650 nm thick film of the PS-b-PI thin film on a silicon wafer, the Fddd phase was developed after annealing at 215 °C for 24 h. The single network structure consists of the connected tripodal units of minor PS block domains. The {111}Fddd plane, the densest plane of the minor PS phase, was found to orient parallel to the film plane. The transitional structure from the wetting layer at the free surface to the internal {111}Fddd plane via a perforated layer structure was also observed.

Graphical abstract: Structural characterization of the Fddd phase in a diblock copolymer thin film by electron microtomography

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Article information

DOI
https://doi.org/10.1039/C1SM06236K
Article type
Paper
Submitted
01 Jul 2011
Accepted
18 Aug 2011
First published
15 Sep 2011

Soft Matter, 2011,7, 10424-10428

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Structural characterization of the Fddd phase in a diblock copolymer thin film by electron microtomography

J. Jung, H. Park, J. Lee, H. Huang, T. Chang, Y. Rho, M. Ree, H. Sugimori and H. Jinnai, Soft Matter, 2011, 7, 10424 DOI: 10.1039/C1SM06236K

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