Issue 2, 2011
From the journal:

Journal of Analytical Atomic Spectrometry

Evaluation of a fourth-generation focal plane camera for use in plasma-source mass spectrometry

Jeremy A. Felton,a   Gregory D. Schilling,†a   Steven J. Ray,a   Roger P. Sperline,b   M. Bonner Denton,b   Charles J. Barinaga,c   David W. Koppenaalc  and  Gary M. Hieftje*a  

* Corresponding authors

a Indiana University, Department of Chemistry, Bloomington, IN, USA
E-mail: hieftje@indiana.edu

b Department of Chemistry, University of Arizona, Tucson, AZ, USA

c Pacific Northwest National Laboratory, Richland, WA, USA

Abstract

A fourth-generation focal plane camera containing 1696 Faraday-strip detectors was fitted to a Mattauch-Herzog mass spectrograph and characterized for its performance with inductively coupled plasma ionization. The camera provides limits of detection in the single to tens of ng Lāˆ’1 range for most elements and has a linear dynamic range of at least nine orders of magnitude. Isotope-ratio precision better than 0.02% has also been achieved with this device, and this fourth-generation system features the broadest simultaneous mass range obtainable to date with this family of focal plane camera detectors.

Graphical abstract: Evaluation of a fourth-generation focal plane camera for use in plasma-source mass spectrometry

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Article information

DOI
https://doi.org/10.1039/C0JA00087F
Article type
Paper
Submitted
26 Jul 2010
Accepted
17 Sep 2010
First published
18 Oct 2010

J. Anal. At. Spectrom., 2011,26, 300-304

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Evaluation of a fourth-generation focal plane camera for use in plasma-source mass spectrometry

J. A. Felton, G. D. Schilling, S. J. Ray, R. P. Sperline, M. B. Denton, C. J. Barinaga, D. W. Koppenaal and G. M. Hieftje, J. Anal. At. Spectrom., 2011, 26, 300 DOI: 10.1039/C0JA00087F

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