Issue 21, 1999

An investigation of C–S bond activation in transition metal crown thioether complexes using extended Hückel theory and electrospray mass spectrometry

Abstract

Complexes of Re and Tc with 1,4,7-trithiacyclononane (9S3) differ from their later transition metal analogues in that their d6 form ([M(9S3)2]+) undergoes instantaneous C–S bond cleavage yielding ethene and [M(9S3)L]+ (L = SCH2CH2SCH2CH2S), a stable metal(III) thiolate complex, cleanly in aqueous solution. This contrast is interpreted as signifying increased π-back donation by Re and Tc, compared to later metals, into ligand C–S σ* orbitals. In order to validate this hypothesis within an established theoretical framework, and to compare the predicted relative C–S bond lability with relative experimental lability in a series of d6 analogues, extended Hückel theory (EHT) was used to investigate the bonding (M = Mo, Tc, Ru, Rh or Pd) while electrospray mass spectrometry (ES-MS) was used to compare ethene loss, in a series of analogous complexes (M = Tc, Re, Ru or Os). The C–S overlap populations were smaller for M = TcII and TcI than for later metal(II) analogues, and were smaller for TcI than for TcII. Fragment molecular orbitals corresponding to C–S σ* were more highly populated for M = TcII and TcI than for later analogues, and also more highly populated for TcI than for TcII. ES-MS showed that ethene loss from Tc/ReI and Tc/ReII complexes occurred at much lower energies than from the Ru/OsII analogues. EHT supports the hypothesis that C–S activation is caused by π-back donation into C–S σ* orbitals, and correctly predicts that ethene loss occurs more readily from rhenium and technetium d5 and especially d6 complexes than from later transition metal analogues.

Article information

Article type
Paper

J. Chem. Soc., Dalton Trans., 1999, 3759-3766

An investigation of C–S bond activation in transition metal crown thioether complexes using extended Hückel theory and electrospray mass spectrometry

G. E. D. Mullen, T. F. Fässler, M. J. Went, K. Howland, B. Stein and P. J. Blower, J. Chem. Soc., Dalton Trans., 1999, 3759 DOI: 10.1039/A905976H

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