Abstract
A transient interferometric technique to measure the thermal expansion of pure metals and alloys during rapid heating is presented. The metallic specimen is resistively heated from room temperature to a high temperature close to melting within approximately 500 ms by the passage of a high electrical current pulse. The temperature of the specimen is measured and time resolved by a fast pyrometer; the thermal expansion is obtained by a high-speed laser-interferometer. The device used is a modified polarized-beam Michelson-type interferometer with a phase-quadrature detector that distinguishes between expansion and contraction. Details of its principle, the construction, adjustment, and operation are described. In addition, thermal expansion measurements performed on molybdenum and tungsten standard reference materials (SRMs) are presented and compared with results obtained by other researchers.
Similar content being viewed by others
REFERENCES
P. Reiter and E. Kaschnitz, High Temp.-High Press, 33:505 (2001).
E. Kaschnitz and P. Reiter, J. Thermal Analysis Calorimetry 64:351 (2001).
A. P. Miiller and A. Cezairliyan, Int. J. Thermophys. 3:259 (1982).
A. P. Miiller and A. Cezairliyan, Int. J. Thermophys. 6:695 (1985).
A. P. Miiller and A. Cezairliyan, Int. J. Thermophys. 11:619 (1990).
V. A. Petukhov, V. Ya. Chekhovskoi, and V. M. Zaichenko, Translated from Teplofizika Vysokikh Temperatur 14:724 (1976).
V. A. Petukhov and V. Ya. Chekhovskoi, High Temp.-High Press. 4:671 (1972).
In-Kook Suh, H. Ohta, and Y. Waseda, J. Materials Science 23:757 (1988).
Y. Waseda, K. Hirata, and M. Ohtani, High Temp.-High Press. 7:221 (1975).
L. R. Fokin and V. Ya. Chekhovskoi, Translated from Teplofizika Vysokikh Temperatur 29:94 (1991).
G. K. White and R. B. Roberts, High Temp.-High Press. 15:321 (1983).
R. K. Kirby, High Temp.-High Press. 4:459 (1972).
K. Wang and R. R. Reeber, Materials Science and Engineering R23:101 (1998).
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Reiter, P., Kaschnitz, E. Measurement of Thermal Expansion at High Temperature by a Transient Interferometric Technique. International Journal of Thermophysics 23, 1327–1338 (2002). https://doi.org/10.1023/A:1019864909136
Issue Date:
DOI: https://doi.org/10.1023/A:1019864909136