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Grain Boundaries in Barium Strontium Titanate Thin Films: Structure, Chemistry and Influence on Electronic Properties

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Interface Science

Abstract

In this paper, we investigate the role of grain boundaries in polycrystalline (Ba x Sr1−x )Ti1+y O3+z films, grown by metal organic vapor deposition, in the accommodation of nonstoichiometry, as well as their role in the strong composition dependence of the electric and dielectric behavior observed in these films. High-spatial resolution electron energy-loss spectroscopy is used for the analysis of composition and structural changes at grain boundaries, as a function of film composition. The existence of amorphous, titanium rich, TiO2-like phases at the grain boundaries of films with large amounts of excess Ti (y ≥ 0.08) may explain the non-monotonic resistance degradation behavior of the films as a function of Ti content. However, we show that a grain boundary phase model fails to explain the strong composition dependence of the dielectric behavior. Electron energy-loss spectra indicate a distortion of the Ti–O octahedra in the grain interiors in samples with increasing Ti excess. The decrease of the dielectric constant with increasing amounts of excess Ti is therefore more likely due to Ti accommodation in the grain interiors.

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References

  1. A.I. Kingon, S.K. Streiffer, C. Basceri, and S.R. Summerfelt, MRS Bulletin 21, 46 (1996).

    Google Scholar 

  2. D. Dimos and C.H. Mueller, Annu. Rev. Mater. Sci. 28, 397 (1998).

    Google Scholar 

  3. C. Basceri, S.E. Lash, C.B. Parker, S.K. Streiffer, A.I. Kingon, M. Grossmann, S. Hoffmann, M. Schumacher, R. Waser, S. Bilodeau, R. Carl, P.C. Van Buskirk, and S.R. Summerfelt, in Ferroelectric Thin Films VI, edited by R.E. Treece, R.E. Jones, C.M. Foster, S.B. Desu, and I.K.Yoo (Materials Research Society Symposium Proceedings, Warrendale, 1998), Vol. 493, p. 9.

  4. S.M. Bilodeau, R. Carl, P.C. Van Buskirk, J.F. Roeder, C. Basceri, S.E. Lash, C.B. Parker, S.K. Streiffer, and A.I. Kingon, J. Korean. Phys. Soc. 32, S1591 (1998).

    Google Scholar 

  5. S.K. Streiffer, C. Basceri, C.B. Parker, S.E. Lash, and A.I. Kingon, J. Appl. Phys. 86, 4565 (1999).

    Google Scholar 

  6. S. Yamamichi, H. Yabuta, T. Sakuma, and Y. Miyasaka, Appl. Phys. Lett. 64, 1644 (1994).

    Google Scholar 

  7. T. Kawahara, M. Yamamuka, T. Makita, J. Naka, A. Yuuki, N. Mikami, and K. Ono, Jpn. J. Appl. Phys. Part 1 33, 5129 (1994).

    Google Scholar 

  8. G.W. Dietz, M. Schumacher, R. Waser, S.K. Streiffer, C. Basceri, and A.I. Kingon, J. Appl. Phys. 82, 2359 (1997).

    Google Scholar 

  9. Y. Fukuda, K. Numata, K. Aoki, A. Nishimura, G. Fujihashi, S. Okamura, S. Ando, and T. Tsukamoto, Jpn. J. Appl. Phys. Part 2 37, L453 (1998).

    Google Scholar 

  10. C. Basceri, S.K. Streiffer, A.I. Kingon, and R. Waser, J. Appl. Phys. 82, 2497 (1997).

    Google Scholar 

  11. R.Waser and D.M. Smyth, in Ferroelectric Thin Films: Synthesis and Basic Properties, edited by C.P.D. Araujo, J.F. Scott, and G.W. Taylor (Gordon and Breach, Amsterdam, 1996), p. 47.

    Google Scholar 

  12. M.H. Frey, Z. Xu, P. Han, and D.A. Payne, Ferroelectrics 206, 337 (1998).

    Google Scholar 

  13. M. Copel, P.R. Duncombe, D.A. Neumayer, T.M. Shaw, and R.M. Tromp, Appl. Phys. Lett. 70, 3227 (1997).

    Google Scholar 

  14. S.K. Streiffer, C. Basceri, A.I. Kingon, S. Lipa, S. Bilodeau, R. Carl, and P.C. Van Buskirk, in Metal-organic Chemical Vapor Deposition of Electronic Ceramics II, edited by S.B. Desu, D.B. Beach, and P.C. Van Buskirk (Materials Research Society Symposium Proceedings, Pittsburgh, 1996), Vol. 415.

  15. R.K. Sharma, N.-H. Chan, and D.M. Smyth, J. Am. Ceram. Soc. 64, 448 (1981).

    Google Scholar 

  16. S. Witek, D.M. Smyth, and H. Pickup, J. Am. Ceram. Soc. 67, 372 (1984).

    Google Scholar 

  17. P.C. van Buskirk, J.F. Roeder, and S. Bilodeau, Intergr. Ferroelectrics 10, 9 (1995).

    Google Scholar 

  18. E.M. James and N.D. Browning, Ultramicroscopy 78, 125 (1999).

    Google Scholar 

  19. N.D. Browning, M.F. Chisholm, and S.J. Pennycook, Nature 366, 143 (1993).

    Google Scholar 

  20. P.E. Batson, Nature 366, 727 (1993).

    Google Scholar 

  21. R.F. Egerton, Electron Energy-Loss Spectroscopy in the Electron Microscope, 2nd edition (Plenum Press, New York, 1996).

    Google Scholar 

  22. F.M.F. deGroot, J. Electron Spectrosc. Relat. Phenom. 67, 529 (1994).

    Google Scholar 

  23. R. Brydson, H. Sauer, W. Engel, and F. Hofer, J. Phys.: Condens. Matter 4, 3429 (1992).

    Google Scholar 

  24. F.M.F. deGroot, J. Faber, J.J. Michiels, M.T. Czyzyk, M. Abbate, and J.C. Fuggle, Phys. Rev. B 48, 2074 (1993).

    Google Scholar 

  25. R. Brydson, H. Sauer, W. Engel, J.M. Thomas, E. Zeitler, N. Kosugi, and H. Kuroda, J. Phys.: Condens. Matter 1, 797 (1989).

    Google Scholar 

  26. N.D. Browning, H.O. Moltaji, and J.P. Buban, Phys. Rev. B 58, 8289 (1998).

    Google Scholar 

  27. I. Levin, R.D. Leapman, D.L. Kaiser, P.C. van Buskirk, S. Bilodeau, and R. Carl, Appl. Phys. Lett. 75, 1299 (1999).

    Google Scholar 

  28. S. Stemmer, S.K. Streiffer, N.D. Browning, and A.I. Kingon, Appl. Phys. Lett. 74, 2432 (1999).

    Google Scholar 

  29. D.J. Wallis and N.D. Browning, J. Am. Ceram. Soc. 80, 781 (1997).

    Google Scholar 

  30. D. Bäuerle, W. Braun, V. Saile, G. Sprüssel, and E.E. Koch, Z. Physik B 29 (1978).

  31. B. Mayer, S. Mähl, and M. Neumann, Z. Phys. B 101, 83 (1996).

    Google Scholar 

  32. M. Cardona, Phys. Rev. 140, A651 (1965).

    Google Scholar 

  33. S. Chattopadhyay, A. Teren, B.H. Hoerman, J.-H. Hwang, T.O. Mason, and B.W. Wessels, presentation at the Electronic Materials Conference, Santa Barbara, 1999.

  34. I.P. Batra, P. Wurfel, and B.D. Silverman, Phys. Rev. B 8, 3257 (1973).

    Google Scholar 

  35. C. Zhou and D.M. Newns, J. Appl. Phys. 82, 3081 (1997).

    Google Scholar 

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Authors and Affiliations

  1. Department of Mechanical Engineering and Materials Science, Rice University, Houston, TX, 77005-1892, USA

    S. Stemmer

  2. Materials Science Division, Argonne National Laboratory, Argonne, IL, 60439-4838, USA

    S.K. Streiffer

  3. Department of Physics, University of Illinois at Chicago, Chicago, IL, 60607-7059, USA

    N.D. Browning

  4. Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC, 27695-7907, USA

    C. Basceri & A.I. Kingon

Authors
  1. S. Stemmer
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  2. S.K. Streiffer
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  4. C. Basceri
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  5. A.I. Kingon
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Stemmer, S., Streiffer, S., Browning, N. et al. Grain Boundaries in Barium Strontium Titanate Thin Films: Structure, Chemistry and Influence on Electronic Properties. Interface Science 8, 209–221 (2000). https://doi.org/10.1023/A:1008794520909

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