Abstract
The structural, electrical and optical properties of single sol-gel derived antimony-doped tin oxide (ATO) films sintered at 550°C have been measured. The reproducibility of both the preparation and the characterization procedures have been tested by a round-robin test involving eight laboratories within a Concerted European Action (CEA) project. The resistivity measured as a function of Sb content has been obtained by electric and reflectance and transmission measurements. Their differences are discussed in terms of structural and grain boundary effects. An increase of Sb content results in a decrease of the crystallite size (7.0 to 5.4 nm) and a greater influence of the grain boundary.
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Guglielmi, M., Menegazzo, E., Paolizzi, M. et al. Sol-Gel Deposited Sb-Doped Tin Oxide Films. Journal of Sol-Gel Science and Technology 13, 679–683 (1998). https://doi.org/10.1023/A:1008636804449
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DOI: https://doi.org/10.1023/A:1008636804449