Comptes Rendus
no. 2-3
Electron microscopy / Microscopie électronique
Future directions in high-resolution electron microscopy: Novel optical components and techniques
[L'avenir de la microscopie électronique à haute résolution : Éléments et techniques innovantes]
Peter Hawkes1
1 CEMES–CNRS, BP 94347, 31055 Toulouse cedex, France
Comptes Rendus. Physique, Volume 15 (2014) no. 2-3, pp. 110-118.

La microscopie à haute résolution est actuellement dominée par les microscopes électroniques équipés de correcteurs d'aberration, mais ces instruments ne sont pas les seuls capables d'atteindre le domaine de la haute résolution. D'autres techniques les concurrencent, notamment la ptychographie et l'utilisation des dispositifs à phase. De plus, l'opération des microscopes corrigés soulève des incertitudes. Notons que les correcteurs peuvent jouer d'autres rôles que la correction, la création de faisceaux vorticiels, par exemple. En conclusion, la correction par miroir électronique est évoquée.

Aberration-corrected electron microscopes currently dominate the high-resolution scene but they are not the only instruments that can provide such information. Other techniques are attracting attention, notably ptychography and the use of phase plates. Moreover, operation of these aberration-corrected microscopes at their ultimate performance raises questions that are still under discussion. We note too that correctors can be useful for tasks other than correction, such as vortex beam creation. To conclude, the specialized role of electron mirrors is recalled.

Publié le :
DOI : 10.1016/j.crhy.2013.11.003
Keywords: Aberration correctors, Noise, Mirrors, Ptychography, Phase plates, Vortex beams
Mot clés : Correcteurs d'aberrations, Bruit, Mirroirs, Ptychographie, Dispositifs à phase, Faisceaux vorticiels
Peter Hawkes 1

1 CEMES–CNRS, BP 94347, 31055 Toulouse cedex, France 
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Peter Hawkes. Future directions in high-resolution electron microscopy: Novel optical components and techniques. Comptes Rendus. Physique, Volume 15 (2014) no. 2-3, pp. 110-118. doi : 10.1016/j.crhy.2013.11.003. https://comptes-rendus.academie-sciences.fr/physique/articles/10.1016/j.crhy.2013.11.003/

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