Reflection electron microscopy (REM) of vicinal surfaces of fcc metals

doi:10.1016/0304-3991(83)90233-4

Ultramicroscopy

Volume 11, Issues 2–3, 1983, Pages 167-172

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Abstract

REM has been applied to study the low index facets and their vicinal regions on Au and Pt spheres solidified from the melt. Areas of regularly spaced steps have caused splitting of diffraction spots, and the splitting in the diffraction pattern agrees with the periodicity of steps as measured in the REM image. Resolution limits for REM images are discussed and compared to the 9 Å resolution experimentally achieved.

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Reflection electron microscopy (REM) of vicinal surfaces of fcc metals

Abstract

Ultramicroscopy

Surface Sci.

Surface Sci.

Surface Sci.

Surface Sci.

J. Microsc. Spectrosc. Electron.