Degradations in the electrical and structural characteristics of Schottky diodes and ohmic contacts to GaAs due to thermal aging☆
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1998, Journal of Research of the National Institute of Standards and TechnologyAnnealing studies on Pd/n-GaAs Schottky diodes
1991, Semiconductor Science and TechnologySuitability of GaAs Schottky metallizations for continuous device operation at elevated temperatures up to 300°C: a comparative study
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1986, Journal of Applied Physics
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Paper presented at the International Conference on Metallurgical Coatings, San Diego, CA, U.S.A., April 9–13, 1984.
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Copyright © 1985 Published by Elsevier B.V.