Induction of dominant lethality by X-rays in a radiosensitive strain of yeast

doi:10.1016/0027-5107(73)90096-1

Mutation Research/Fundamental and Molecular Mechanisms of Mutagenesis

Volume 20, Issue 1, October 1973, Pages 45-51

https://doi.org/10.1016/0027-5107(73)90096-1 Get rights and content

Abstract

X-Ray-survival curves of haploid, diploid, triploid and tetraploid yeast strains homozygous for the X-ray-sensitive mutation rad52 (previously xs1 are presented. These curves suggest that strains carrying the rad52 mutation may be more susceptible than wild type to X-ray-induced dominant lethal damage. For the crosses (+ × +, rad52 × rad52, + × rad52, rad52 × +) in which only one parent was irradiated, the relationships between zygote survival and X-ray dose were similar except for rad52 × rad52. In this cross a considerably higher frequency of dominant lethal damage was observed. This observation indicates that the rad52 mutant lacks a repair system for X-ray damage and is consistent with the proposal that unrepaired chromosome damage is the event which leads to dominant lethality and reproductive cell death.

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Induction of dominant lethality by X-rays in a radiosensitive strain of yeast

Abstract

Mutation Res.

Mutation Res.

Informational transfer in meiotic gene conversion

Inaktivierungsversuche mit homozygoten Hefestammen verschiedenen Ploidiegrades

Z. Naturforsch.

Actions of Radiations on Living Cells