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The effect of γ-ray irradiation on the adsorption properties and chemical stability of AMP/SiO2 towards Cs(I) in HNO3 solution

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Abstract

Silica based ammonium molybdophosphate (AMP/SiO2) adsorbent was used to remove Cs(I) from HNO3 solution. The adsorbent with different absorbed dose (0–300 kGy) was characteristed by X-ray power diffraction. The adsorption data against different γ-ray absorbed doses were analyzed by the Langmuir isotherm. The adsorption capacity decreased slightly from 23.22 to 22.37 mg/g with the increase of the absorbed dose. The breakthrough properties of Cs(I) were conducted using column packed with AMP/SiO2 before and after irradiation. The chemical stability of AMP/SiO2 at 300 kGy absorbed dose in 3 mol/L (M) HNO3 was excellent.

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Acknowledgments

This work was supported by the National Natural Science Foundation of China (11405106) and the Scientific Research Foundation for the Returned Overseas Chinese Scholars, State Education Ministry.

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Authors and Affiliations

  1. School of Nuclear Science and Engineering, Shanghai Jiaotong University, Shanghai, 200240, China

    Xiaoxia Zhang, Yan Wu & Yuezhou Wei

  2. Guangxi Supervising Station for Radioactive Enviroment, Nanning, 530222, China

    Baocai Chen

  3. College of Resources and Metallurgy, Guangxi University, Nanning, 530004, China

    Yuezhou Wei

Authors
  1. Xiaoxia Zhang
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  2. Yan Wu
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  3. Baocai Chen
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  4. Yuezhou Wei
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Correspondence to Yan Wu.

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Zhang, X., Wu, Y., Chen, B. et al. The effect of γ-ray irradiation on the adsorption properties and chemical stability of AMP/SiO2 towards Cs(I) in HNO3 solution. J Radioanal Nucl Chem 310, 905–910 (2016). https://doi.org/10.1007/s10967-016-4862-x

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  • DOI: https://doi.org/10.1007/s10967-016-4862-x

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