Abstract
We have investigated the voltage response of superconducting NbTiN strips to a step-pulse of overcritical current in the range of temperatures 0.4 < T/T c < 0.9, where the critical temperature, T c , is 8.7 K. The current-induced destruction of the Cooper pairs leads to the nucleation of a phase-slip center. The response appears after a certain delay time t d , which we analyze through a Time-Dependent Ginzburg-Landau (TDGL) theory according to Tinkham’s approach. The experimental findings can be fitted by inferring a film cooling time of about 1.8 ns for a 20-nm-thick film, very little dependent upon sample width and temperature. Assuming a definite ratio between the electron and phonon specific heats, one deduces an average phonon escape time of 90 ps per nm thickness of NbTiN film sputtered on sapphire.
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Acknowledgments
Authors gratefully acknowledges the support of the King Fahd University of Petroleum and Minerals, Saudi Arabia, under the IN131034 DSR project.
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Harrabi, K., Bakare, F.O., Oktasendra, F. et al. Temperature Dependence of the Phonon Escape Time Deduced from the Nucleation Time of Phase Slip Center in Superconducting NbTiN Thin Film. J Supercond Nov Magn 30, 1349–1352 (2017). https://doi.org/10.1007/s10948-016-3833-3
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DOI: https://doi.org/10.1007/s10948-016-3833-3