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Hanle Effect Measurements of Spin Lifetime in Zn0.4Cd0.6Se Epilayers Grown on InP

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Abstract

We use the Hanle effect to study spin relaxation in Zn x Cd1−xSe epilayers grown on lattice-matched InP substrates. We study three samples with a fixed composition (x = 0.4) and with varying levels of n-doping, as well as an undoped sample with x = 0.5. Our measurements show that the spin relaxation time changes non-monotonically as a function of carrier density, with a maximum transverse spin lifetime of ~10.5 ns at low temperatures for a sample doped near the metal–insulator transition.

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Maksimov, O., Lu, H., Muñoz, M. et al. Hanle Effect Measurements of Spin Lifetime in Zn0.4Cd0.6Se Epilayers Grown on InP. J Supercond 18, 195–199 (2005). https://doi.org/10.1007/s10948-005-3358-7

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  • DOI: https://doi.org/10.1007/s10948-005-3358-7

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