Abstract
We present noise data measured from a Ti/Au transition-edge sensor that is coupled via a dot matrix to a Cu/Bi absorber. The observed noise properties can be explained by a combination of excess white noise and internal thermal fluctuations. Quite unexpectedly, the excess white noise level goes down if one biases the sensor deep enough in the transition.
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Kinnunen, K.M., Nuottajärvi, A.K. & Maasilta, I.J. A Transition-Edge Sensor with Two Excess Noise Mechanisms. J Low Temp Phys 151, 144–149 (2008). https://doi.org/10.1007/s10909-007-9624-2
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DOI: https://doi.org/10.1007/s10909-007-9624-2