Abstract
Vertical and tilted nanorod arrays of Al-doped ZnO were deposited by glancing angle deposition method at room temperature. The morphologies of the samples were varied by adjusting the rotation speed of the substrate. The applicability of various analytical methods was considered in order to understand the structural results. Analysis of X-ray diffraction data showed that the most suitable evaluation of some structural parameters was performed with a ‘strain profile’ model. The values of the grain size and strain obtained from the best fits of this model to the experimental data were reasonable. The bandgap increased with decreasing grain size and increasing strain for the samples. The change in bandgap of the samples was explained by our detailed structural analysis.
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Acknowledgments
One of the authors (A. Y.) acknowledges support from the Turkish Academy of Sciences (2219). Abdulrahman has been supported by an Iraqi Government scholarship. This work was supported by NASA (Grant No. NNX09AW22A) and NSF (Grant Nos. EPS-1003970 and 1159830). The authors thank UALR Center for Integrative Nanotechnology Sciences for helping with SEM images and UV–Vis–NIR measurements.
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Yildiz, A., Cansizoglu, H., Abdulrahman, R. et al. Effect of grain size and strain on the bandgap of glancing angle deposited AZO nanostructures. J Mater Sci: Mater Electron 26, 5952–5957 (2015). https://doi.org/10.1007/s10854-015-3167-0
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DOI: https://doi.org/10.1007/s10854-015-3167-0