Abstract
The potential of terahertz (THz) time domain spectroscopy to simultaneously determine the complex dielectric parameters of materials and their geometrical thickness is of high interest for scientific spectroscopy and for general metrology. This paper provides an overview of the background of the data extraction from THz measurements and discusses the accuracy and ambiguity of this extraction process. It is shown that the signal to noise ratio of the measurement as well as the bandwidth of the accessible THz spectrum define the limitation of the achievable accuracy in the data extraction.
Similar content being viewed by others
References
P. Jepsen, D. G. Cooke, and M. Koch,” Terahertz spectroscopy and imaging – Modern techniques and applications”, Laser & Photonics Review 5, 124 (2011)
D. H. Auston and K. P. Cheung, "Coherent time-domain far-infrared spectroscopy," J. Opt. Soc. Am. B 2, 606-612 (1985).
L. Duvillaret, F. Garet and J. Coutaz, "Highly Precise Determination of Optical Constants and Sample Thickness in Terahertz Time-Domain Spectroscopy", Appl. Opt., 38, 409–415 (1999).
M. Bernier, F. Garet, J. Coutaz, "Precise Determination of the Refractive Index of Samples Showing Low Transmission Bands by THz Time-Domain Spectroscopy," IEEE Transactions on Terahertz Science and Technology, 3, 295–301 (2013).
E. Vartiainen, Y. Ino, R. Shimano, M. Kuwata-Gonokami, Y.P. Svirko, K-E. Peiponen, "Numerical phase correction method for terahertz time-domain reflection spectroscopy," Journal of Applied Physics, 96, 4171–4175 (2004).
M. Scheller, and M. Koch, “Fast and accurate thickness determination of unknown materials using terahertz time domain spectroscopy,” J. of Infrared, Millimeter, and Terahertz Waves 30, 762-769 (2009).
T. Yasui, T. Yasuda, K. Sawanaka and T. Araki, "Terahertz paintmeter for noncontact monitoring of thickness and drying progress in paint film", Appl. Opt., 44, 6849-6856 (2005)
T. Yasuda, T. Iwata, T. Araki, and T. Yasui, "Improvement of minimum paint film thickness for THz paint meters by multiple-regression analysis," Appl. Opt. 46, 7518–7526 (2007)
T. D. Dorney, R. G. Baraniuk and D. M. Mittleman, "Material parameter estimation with terahertz time-domain spectroscopy", J. Opt. Soc. Am. A 18, 1562–1571 (2001).
M. Scheller, C. Jansen and M. Koch, "Analyzing Sub-100 μm Samples with Transmission Terahertz Time Domain Spectroscopy", Opt. Commun. 282, 1304–1306 (2009).
M. Krüger, S. Funkner, E. Bründermann, and M. Havenith. Uncertainty and ambiguity in terahertz parameter extraction and data analysis. Journal of Infrared, Millimeter, and Terahertz Waves 32, 699-715 (2011).
Xiangjun Lia, Zhi Hongb, Jinlong Heb, Yuquan Chena, "Precisely optical material parameter determination by time domain waveform rebuilding with THz time-domain spectroscopy," Optics Communications 283, 4701–4706 (2010)
M. Scheller, "Real-time terahertz material characterization by numerical three-dimensional optimization," Opt. Express 19, 10647–10655 (2011)
J. C. Lagarias, J. A. Reeds, M. H. Wright, and P. E. Wright, "Convergence properties of the nelder–mead simplex method in low dimensions", SIAM J. on Optimization 9, 112–147 (1998).
P. U. Jepsen and B. M. Fischer, "Dynamic range in terahertz time-domain transmission and reflection spectroscopy," Opt. Lett. 30, 29–31 (2005).
W. Withayachumnankul, B. M. Fischer, H. Lin, and D. Abbott, "Uncertainty in terahertz time-domain spectroscopy measurement," J. Opt. Soc. Am. B 25, 1059–1072 (2008)
Withawat Withayachumnankul, Bernd M. Fischer, and Derek Abbott, "Material thickness optimization for transmission-mode terahertz time-domain spectroscopy," Opt. Express 16, 7382–7396 (2008)
I. Pupeza, R. Wilk, and M. Koch, "Highly accurate optical material parameter determination with THz time-domain spectroscopy," Opt. Express 15, 4335-4350 (2007)
Author information
Authors and Affiliations
Corresponding author
Rights and permissions
About this article
Cite this article
Scheller, M. Data Extraction from Terahertz Time Domain Spectroscopy Measurements. J Infrared Milli Terahz Waves 35, 638–648 (2014). https://doi.org/10.1007/s10762-014-0053-4
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1007/s10762-014-0053-4