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Permanent holographic recording in indium oxide thin films using 193 nm excimer laser radiation

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Abstract.

Permanent holographic recording in sputtered indium oxide (InOx) thin films is demonstrated, using ultraviolet radiation at 193 nm emitted by an ArF excimer laser. Steady-state refractive index changes of up to 5×10-3 are calculated from the measured diffraction efficiency of a HeNe laser probe beam. The recorded gratings exhibit a dynamic behaviour that relaxes to a steady-state value that depends on the oxygen partial pressure used during growth and on the recording beam intensity. The observed behaviour is explained in terms of laser-induced structural changes.

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Authors and Affiliations

  1. Optoelectronics Research Centre, Department of Physics and Astronomy and Department of Electronics and Computer Science, Southampton University, Southampton, SO17 1BJ, UK, , , , , , UK

    S. Pissadakis, S. Mailis, L. Reekie, J.S. Wilkinson & R.W. Eason

  2. FO.R.T.H-IESL, Laser and Applications division, P.O. Box 1527, Heraklion 71110, Crete, Greece, , , , , , GR

    N.A. Vainos

  3. FO.R.T.H-IESL, Materials group, P.O. Box 1527, Heraklion 71110, Crete, Greece, , , , , , GR

    K. Moschovis & G. Kiriakidis

Authors
  1. S. Pissadakis
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  2. S. Mailis
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  3. L. Reekie
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  4. J.S. Wilkinson
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  5. R.W. Eason
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  6. N.A. Vainos
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  7. K. Moschovis
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  8. G. Kiriakidis
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Additional information

Received: 12 October 1998 / Accepted: 8 March 1999 / Published online: 4 August 1999

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Pissadakis, S., Mailis, S., Reekie, L. et al. Permanent holographic recording in indium oxide thin films using 193 nm excimer laser radiation . Appl Phys A 69, 333–336 (1999). https://doi.org/10.1007/s003390051009

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  • DOI: https://doi.org/10.1007/s003390051009

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