Abstract
We model degradation in extended two-dimensional solar cells. The model couples electrical and thermal physics, so that voltage and temperature can vary over a device. Degradation is modeled phenomenologically, such that local open circuit voltage degradation is dependent on local temperature. Initial device nonuniformity is introduced with an initial spatial distribution of random shunt conductances. A comparison of pre- to post-stress performance shows variations, despite the deterministic nature of the degradation model, which is interpreted as a consequence of temperature variations.
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NSF award No. 1066749.
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Vasko, A.C., Karpov, V.G. A numerical model of nonuniform solar cell stability. Appl. Phys. A 118, 107–112 (2015). https://doi.org/10.1007/s00339-014-8772-x
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DOI: https://doi.org/10.1007/s00339-014-8772-x