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Liquid titanium solute diffusion measured by pulsed ion-beam melting

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Abstract

The diffusivities of Sn, Mo, Zr, and Hf in liquid Ti were determined by pulsed ion-beam melting of thin liquid layers. Time-resolved optical reflectance and one-dimensional heat-flow simulations were employed to determine the melt duration. The broadening of nearly Gaussian solute concentration-depth profiles was determined ex situ using Rutherford backscattering spectrometry. Solute diffusivities in the range of 5 to 9×10−5 cm2/s were determined at temperatures in the range of 2200 to 2500 K. Calculations of buoyancy and Marangoni convection indicate that convective contamination is unlikely.

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Authors and Affiliations

  1. Ford Research Laboratory, Ford Motor Company, 48121, Dearbom, MI

    P. G. Sanders (Researcher)

  2. the Materials Science and Engineering Department, Cornell University, 14853, Ithaca, NY

    M. O. Thompson (Professor)

  3. the Beam Applications and Initiatives, Sandia National Laboratories, 87185, Albuquerque, NM

    T. J. Renk (Researcher)

  4. the Division of Engineering and Applied Sciences, Harvard University, 02138, Cambridge, MA

    M. J. Aziz (Professor)

Authors
  1. P. G. Sanders
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  2. M. O. Thompson
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  3. T. J. Renk
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  4. M. J. Aziz
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Sanders, P.G., Thompson, M.O., Renk, T.J. et al. Liquid titanium solute diffusion measured by pulsed ion-beam melting. Metall Mater Trans A 32, 2969–2974 (2001). https://doi.org/10.1007/s11661-001-0171-1

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  • DOI: https://doi.org/10.1007/s11661-001-0171-1

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