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An Accurate and Cost-Effective Jitter Measurement Technique Using a Single Test Frequency

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Abstract

An accurate and cost-effective jitter measurement technique is proposed. The new technique uses only a single test with a high frequency input sine wave. Eliminating the need for a 2nd low frequency test, which is required in the conventional dual-frequency jitter test, provides significantly savings in both hardware and data acquisition time. The new technique is computationally efficient since it requires only one FFT together with some simple time domain computation. Furthermore, there are no nonlinear operations involved, hence avoiding errors inherently associated with such operations. Theoretical analysis, extensive simulation results and experimental results show that the proposed technique is cost-effective and achieves comparable test accuracy to that achieved by the conventional dual-frequency test. The new technique is reliable and robust to both harmonic and non-harmonic distortions. The algorithmic simplicity and the relaxed hardware requirement make the new technique potentially suited for built-in self test.

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Authors and Affiliations

  1. Xi’an Jiaotong University, Xi’an, Shaanxi, 710049, China

    Minshun Wu

  2. Department of Electrical and Computer Engineering, Iowa State University, Ames, IA, 50011, USA

    Degang Chen & Jingbo Duan

Authors
  1. Minshun Wu
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  2. Degang Chen
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  3. Jingbo Duan
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Corresponding author

Correspondence to Minshun Wu.

Additional information

Responsible Editor: D. Keezer

This work was supported in part by the National Science Foundation, by the Semiconductor Research Corporation, and by Texas Instruments.

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Wu, M., Chen, D. & Duan, J. An Accurate and Cost-Effective Jitter Measurement Technique Using a Single Test Frequency. J Electron Test 28, 733–743 (2012). https://doi.org/10.1007/s10836-012-5310-7

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  • DOI: https://doi.org/10.1007/s10836-012-5310-7

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