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Dielectric Degradation and Microstructures of Heterogeneous Interfaces in Cofired Multilayer Ceramic Capacitors

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Abstract

The compatibility of electrodes and dielectrics in cofired MLCCs with both Ni and Ag/Pd electrodes was characterized by transmission electron microscopy (TEM) using tripod polished samples. Tripod polishing procedures can reduce entire devices to a thickness of less than 1 μm. After low angle ion milling for a short time, many regions across several dielectric and electrode layers are electron transparent, which makes it possible to characterize the cofired interfacial microstructures. When analyzed by convergent beam electron diffraction (CBED) and energy dispersive X-ray spectrometry (EDS), NiO lamellae and P-rich intermediate layers were found in highly accelerated life tested (HALT) MLCCs with Ni electrodes. CBED confirmed that the P-rich layers had a Ba4Ti13O30 (B4T13) structures. Oxidized Ni layers containing Mn were also found in the HALT samples. It is believed that Mn ions were reduced by the Ni electrodes, as P-rich and Mn-rich segregated layers were observed in the virginal non-life tested MLCCs. Grains with stacking faults, containing dopants such as Mn, Si, and Mg, had the BaTi4O9 (BT4) structure. No silver diffusion was found in either the BaTiO3 based perovskite lattices or the flux phases in air-fired X7R type MLCCs.

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References

  1. S.F. Wang, J.P. Dougherty, W. Huebner, and J.G. Pepin, J. Am. Ceram. Soc., 77(12), 3051 (1994).

    Google Scholar 

  2. R. Zuo, L. Li, and Z. Gui, Ceram. Inter., 26(6), 673 (2000).

    Google Scholar 

  3. R. Zou, L. Li, Z. Gui, T. Hung, and Z. Xu, Mater. Sci. {&} Eng., 95(1), 1 (2002).

    Google Scholar 

  4. R. Zou, L. Li, Y. Tang, and Z. Gui, Mater. Chem. {&} Phys., 69(3), 230 (2001).

    Google Scholar 

  5. H. Kanai, O. Furukawa, S. Nakamura, M. Hayashi, M. Yoshiki, and Y. Yamashita, J. Am. Ceram. Soc., 78(5), 1173 (1995).

    Google Scholar 

  6. D.J. Lewis, D. Gupta, M.R. Notis, and Y. Imanaka, J. Am. Ceram. Soc., 84(8), 1777 (2001).

    Google Scholar 

  7. C.Y. Chen and W.H. Tuan, J. Am. Ceram. Soc., 83(7), 1693 (2000).

    Google Scholar 

  8. C.Y. Chen and W.H. Tuan, J. Am. Ceram. Soc., 83(12), 2988 (2000).

    Google Scholar 

  9. R.Z. Chen, X.H. Wang, Z.L Gui, and L.T. Li, J. Am. Ceram. Soc., 86(6), 1022 (2003).

    Google Scholar 

  10. B.E. Taylor, J.J. Felten, and J.R. Larry, IEEE Trans. Compon., Hybrid, Manuf. Technol., CHMT-3(2), 504 (1980).

    Google Scholar 

  11. S. Sumita, M. Lkeda, Y. Nakano, K. Nishiyama, and T. Nomura, J. Am. Ceram. Soc., 74(11), 2739 (1991).

    Google Scholar 

  12. J. Rodel and G. Tomandl, J. Mater. Sci., 19(11), 3515 (1984).

    Google Scholar 

  13. S.J. Klepeis, J.P. Benedict, and R.M. Anderson, in Materials Research Society Symposium Proceedings, Vol. 115, Specimen Preparation for Transmission Electron Microscopy of Materials, edited by J.C. Bravman, R.M. Anderson, and M.L. McDonald (Materials Research Society, Pittsburgh, PA, 1988), pp. 179–184.

    Google Scholar 

  14. J.P. Benedict, R.M. Anderson, S.J. Klepeis, and M. Chaker, in Materials Research Society Symposium Proceedings, Vol. 199, Specimen Preparation for Transmission Electron Microscopy of Materials, edited by R.M. Anderson (Materials Research Society, Pittsburgh, PA, 1990), pp. 189–204.

    Google Scholar 

  15. R. Anderson, S. Klepeis, and J. Benedict, South Bay Technology’s Technical Library, Report Number 33.

  16. Q. Feng, C.J. McConville, and D.D. Edwards, J. Am. Ceram. Soc. (in press).

  17. T. Suzuki, M. Ueno, Y. Nishi, and M. Fujimoto, J. Am. Ceram. Soc., 84(1), 200 (2001).

    Google Scholar 

  18. C. Metzmacher and K. Albertsen, J. Am. Ceram. Soc., 84(4), 821 (2001).

    Google Scholar 

  19. R. Waser, T. Baiatu, and K.H. Hardfl, J. Am. Ceram. Soc., 73(6), 1645 (1990).

    Google Scholar 

  20. R. Waser, T. Baiatu, and K.H. Hardfl, J. Am. Ceram. Soc., 73(6), 1654 (1990).

    Google Scholar 

  21. R. Waser, T. Baiatu, and K.H. Hardfl, J. Am. Ceram. Soc., 73(6), 1663 (1990).

    Google Scholar 

  22. N.H. Chan, R.K. Sharma, and D.M. Smyth, J. Am. Ceram. Soc., 65(3), 167 (1982).

    Google Scholar 

  23. X.W. Zhang, Y.H. Han, M. Lal, and D.M. Smyth, J. Am. Ceram. Soc., 70(2), 100 (1987).

    Google Scholar 

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  1. The New York State College of Ceramics at Alfred University, Alfred, New York, 14802, USA

    Qiquan Feng & Caspar J. McConville

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  1. Qiquan Feng
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  2. Caspar J. McConville
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Correspondence to Qiquan Feng.

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Feng, Q., McConville, C.J. Dielectric Degradation and Microstructures of Heterogeneous Interfaces in Cofired Multilayer Ceramic Capacitors. J Electroceram 14, 213–220 (2005). https://doi.org/10.1007/s10832-005-0960-9

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  • DOI: https://doi.org/10.1007/s10832-005-0960-9

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