Abstract
Effect of absorber thickness on the X-ray K absorption edge of nickel has been recorded photographically. The extended structures show a variation in their relative intensities. In agreement with the earlier observations of Parratt and Sawada the structures in the immediate neighbourhood of the edge show a decrease in their absorption intensities and the fluctuations following them up to 140 eV. remain unaltered. In addition, it is found that the structures lying beyond 150 eV. from the edge become more pronounced on the increase of absorber thickness.
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References
Hayasi, T...Sci. Rep. Tohoku Univ, I Series, 1949,33, 123 and 183.
Parratt, L. G., Hempstead, C. F. and Jossem, E. L.Phy. Rev., 1957,105, 1228.
Tsutsumi, K., Obashi, M. and Sawada, M.Jour. Phys. Soc., Japan, 1958,13, 43.
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Communicated by Dr. R. K. Asundi,f.a.sc.
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Krishnan, T.V., Nigam, A.N. Thickness effect in the X-ray K absorption edge of nickel. Proc. Indian Acad. Sci. 65, 45–48 (1967). https://doi.org/10.1007/BF03047533
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DOI: https://doi.org/10.1007/BF03047533