Abstract
Precision lattice parameter measurements have been made for various dopants as a function of doping concentration in order to provide a basis for understanding the reduction in dislocation density in heavily doped crystals. For the two dopants, Zn and S, which most effectively reduce the dislocation density, a monotonic decrease in lattice parameter with concentration is found for concentrations up to the mid 1018 cm-3 level. On the other hand, a slight increase in lattice parameter is found for doping with tin which dose not reduce the dislocation density.
Similar content being viewed by others
References
A.S. Jordan, R. Caruso, and A.R. Von Neida, B.S.T.J.59, 593 (1981).
Y. Seki, H. Watanabe, and J. Matsui, J. Appl. Phys.49, 822 (1978).
S. Mahajan, W. A. Bonner, A. K. Chin, and D. C. Miller, Appl. Phys. Lett.35, 165 (1979).
G. T. Brown, B. Cockayne, and W. R. MacEvan, J. Cryst. Growth51, 369(1981).
P. A. Kirkby, IEEE J. Quantum Electron. QE-11, 562 (1975).
V. Swaminathan and S. M. Copley, J. Appl. Phys.47, 4405(1976).
H. Nagai, Jpn. J. Appl. Phys.20, 793 (1981).
T. Kamejima, J. Matsui, Y. Seki, and H. Watanabe, J. Appl. Phys.50, 3312 (1979).
E. Kubota and K. Sugii, J. Appl. Phys.52, 2983 (1981).
Y. Ohmori, K. Sugii, S. Akai, and K. Matsumoto, J. Cryst. Growth60, 79 (1982).
C. M. H. Driscoll, A. F. W. Willoughby, J. B. Mullin, and B. W. Straughan, Inst. Phys. Conf. Ser., No24, 275 (1975).
M. Renninger, Acta Cryst.8, 1957 (1955).
K. Sugii, M. Fukuma, and H. Iwasaki, J. Mater. Science13, 523 (1978).
W. H. Zachariasen, “The theory of X-ray diffraction in crystals” Wiley, New York, 1945).
S. Kikuta, T. Matsushita, and K. Kohra, Phy. Rev. Lett.33A, 151(1970).
W. L. Bond, Acta Cryst.13, 814 (1960).
International Tables for X-ray Crystallography, IV Birmingham: Kynoch Press.
J. B. Nelson and D. P. Riley, Proc. Phys. Soc. London57, 160 (1945).
P. J. Roksnoer, J. M. P. L. Huijbregts, W. M. Van de Wijgert, and A. J. R. Dekock, J. Cryst. Growth40, 6 (1977).
J. F. Baker, M. Hart, M. A. G. Halliwell, and R. Heckingbottom, Solid State Electron. 19, 331 (1976).
J. C. Phillips, “Bonds and bands in semiconductors” Academic Press (1973).
S. Mahajan and A. K. Chin, J. Cryst. Growth54, 138 (1981).
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Sugii, K., Koizumi, H. & Kubota, E. Precision lattice parameter measurements on doped indium phosphide single crystals. J. Electron. Mater. 12, 701–712 (1983). https://doi.org/10.1007/BF02676797
Received:
Revised:
Issue Date:
DOI: https://doi.org/10.1007/BF02676797