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Optical characterization of polyethylene films by refractometry

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Abstract

Refractometrical measurements of polyethylene films have been obtained using a modified Abbe's refractometer that includes polarized and monochromatic light. The ordinary and extraordinary refractive index values have been obtained considering an anisotropic uniaxic model. These values are analysed in relation to the previously known degree of crystallinity in the samples of this material. The specular reflectance is derived from the Fresnel formulae and an evaluation of diffused reflectance has been made. We find that the diffuse reflectance values increase with average roughness of the polyethylene films. This question is of particular interest for the surface characterization of these materials.

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Authors and Affiliations

  1. Departamento de Optica, Facultad de Ciencias Fisicas, Universidad Complutense, 28040, Madrid, Spain

    E. Bernabeu & J. M. Boix

  2. Departamento de Ingeniería Química Industrial, E.T.S.I. Industriales, Universidad Politécnica, 28006, Madrid, Spain

    A. Larena & G. Pinto

Authors
  1. E. Bernabeu
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  2. J. M. Boix
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  3. A. Larena
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  4. G. Pinto
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Bernabeu, E., Boix, J.M., Larena, A. et al. Optical characterization of polyethylene films by refractometry. JOURNAL OF MATERIAL SCIENCE 28, 5826–5830 (1993). https://doi.org/10.1007/BF00365188

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  • DOI: https://doi.org/10.1007/BF00365188

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