Abstract
This article aims to summarise the promising results obtained during a recently finished project conducted at the Swiss Federal Institute of Technology Zurich. The goal of this work was to develop image-shearing speckle pattern interferometry, also known as shearography, into a method for quantitative strain analysis. This development implied a theoretical analysis of shearography, a concept for the extraction of the strains from the measured images, the implementation of original image processing routines (filtering of the phase fringe patterns, removal of the image doubling), and the design of specific measurement equipment.
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References
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Waldner, S., Goudemand, N. (2000). Quantitative Strain Analysis With Image Shearing Speckle Pattern Interferometry. In: Jacquot, P., Fournier, JM. (eds) Interferometry in Speckle Light. Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-642-57323-1_40
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DOI: https://doi.org/10.1007/978-3-642-57323-1_40
Publisher Name: Springer, Berlin, Heidelberg
Print ISBN: 978-3-642-63230-3
Online ISBN: 978-3-642-57323-1
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