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Application of Digital Image Correlation to the Thick Adherend Shear Test

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Joining Technologies for Composites and Dissimilar Materials, Volume 10

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Abstract

The purpose of this study was to develop and validate a novel method for measuring shear deformation during the Thick Adherend Shear Test (TAST), to determine in situ mechanical properties of an adhesive under tensile shear loading, using two-dimensional (2D) Digital Image Correlation (DIC). Shear strains were optically measured using DIC from the bond line and also from adherend deformations; both were compared against measurements made using the ASTM D5656 standard (KGR-1 extensometers). The results from 17 TAST specimens showed that all techniques were in good agreement, however, both DIC techniques had significantly lower variance on measured mechanical properties compared to the KGR-1 extensometers. The use of correlated adherend deformations was the preferred technique for deriving plastic shear strains, and overall produced the lowest scatter on mechanical properties. This study demonstrates the potential for the use of 2D DIC as a more precise, and time-efficient alternative to the KGR-1 extensometers for room temperature in situ characterization of adhesives in shear.

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Acknowledgement

The technical support of Richard Desnoyers and Matthieu Harrison of NRC-Aerospace and Dr. Steven Philips of McGill University are gratefully acknowledged.

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Authors and Affiliations

  1. Department of Mechanical and Aerospace Engineering, Carleton University, 1125 Colonel By Drive, Ottawa, ON, Canada, K1S 5B6

    Jared Van Blitterswyk & Jeremy Laliberté

  2. National Research Council Canada, Aerospace Portfolio, 1200 Montreal Road, Ottawa, ON, Canada, K1A 0R6

    David Backman & Richard Cole

Authors
  1. Jared Van Blitterswyk
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  2. David Backman
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  3. Jeremy Laliberté
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  4. Richard Cole
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Corresponding author

Correspondence to David Backman .

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Editors and Affiliations

  1. Composite Vehicle Research Center, Michigan State University, Lansing, Michigan, USA

    Gary L. Cloud

  2. University of Liverpool, Liverpool, United Kingdom

    Eann Patterson

  3. National Research Council Canada, Ottawa, Canada

    David Backman

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Van Blitterswyk, J., Backman, D., Laliberté, J., Cole, R. (2017). Application of Digital Image Correlation to the Thick Adherend Shear Test. In: Cloud, G., Patterson, E., Backman, D. (eds) Joining Technologies for Composites and Dissimilar Materials, Volume 10. Conference Proceedings of the Society for Experimental Mechanics Series. Springer, Cham. https://doi.org/10.1007/978-3-319-42426-2_9

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  • DOI: https://doi.org/10.1007/978-3-319-42426-2_9

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  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-319-42425-5

  • Online ISBN: 978-3-319-42426-2

  • eBook Packages: EngineeringEngineering (R0)

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