Abstract
Local feature descriptors are widely used in many computer vision applications. Over the past couple of decades, several local feature descriptors have been proposed which are robust to challenging conditions. Since they show different characteristics in different environment, it is necessary to evaluate their performance in an intensive and consistent manner. However, there has been no relevant work that addresses this problem, especially for the affine invariant region detectors which are popularly used in object recognition and classification. In this paper, we present a useful and rigorous performance evaluation of local descriptors for affine invariant region detector, in which MSER (maximally stable extremal regions) detector is employed. We intensively evaluate local patch based descriptors as well as binary descriptors, including SIFT (scale invariant feature transform), SURF (speeded up robust features), BRIEF (binary robust independent elementary features), FREAK (fast retina keypoint), Shape descriptor, and LIOP (local intensity order pattern). Intensive evaluation on standard dataset shows that LIOP outperforms the other descriptors in terms of precision and recall metric.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
References
Karlsson, N., Bernardo, E.D., Ostrowski, J., Goncalves, L., Pirianian, P., Munich, M.E.: The vSLAM algorithm for robust localization and mapping. In: Proceedings of IEEE International Conference on Robotics and Automation, pp. 24–29 (2005)
Agarwal, S., Furukawa, Y., Snavely, N., Simon, I., Curless, B., Seitz, S.M., Szeliski, R.: Building Rome in a day. Commun. ACM 54, 105–112 (2011)
Lowe, D.G.: Object recognition from local scale-invariant features. In: Proceedings of IEEE International Conference on Computer Vision, vol. 2, pp. 1150–1157 (1999)
Zhou, H., Yuan, Y., Shi, C.: Object tracking using SIFT features and mean shift. Comput. Vis. Image Underst. 113, 345–352 (2009)
Serrano, N., Savakis, A.E., Luo, J.: Improved scene classification using efficient low-level features and semantic cues. Pattern Recogn. 37, 1773–1784 (2004)
Lowe, D.G.: Distinctive image features from scale-invariant keypoints. Int. J. Comput. Vis. 60, 91–110 (2004)
Bay, H., Ess, A., Tuytelaars, T., Gool, L.V.: Speeded-up robust features. Comput. Vis. Image Underst. 110, 346–359 (2008)
Mikolajczyk, K., Schmid, C.: A performance evaluation of local descriptors. IEEE Trans. Pattern Anal. Mach. Intell. 27, 1615–1630 (2005)
Mikolajczyk, K., Schmid, C.: Scale and affine invariant interest point detectors. Int. J. Comput. Vis. 60, 63–86 (2004)
Mikolajczyk, K., Tuytelaars, T., Schmid, C., Zisserman, A., Matas, J., Schaffalitzky, F., Kadir, T., Gool, L.V.: A comparison of affine region detectors. Int. J. Comput. Vis. 65, 43–72 (2005)
Matas, J., Chum, O., Urban, M., Pajdla, T.: Robust wide baseline stereo from maximally stable extremal regions. In: Proceedings of the British Machine Vision Conference, vol. 1, pp. 384–393 (2002)
Forssen, P.E., Lowe, D.G.: Shape descriptors for maximally stable extremal regions. In: Proceedings of IEEE International Conference on Computer Vision, pp. 1–8 (2007)
Calonder, M., Lepetit, V., Strecha, C., Fua, P.: BRIEF: Binary robust independent elementary features. In: Proceedings of European Conference on Computer Vision, pp. 778–792 (2010)
Alahi, A., Ortiz, R., Vandergheynst, P.: FREAK: Fast retina keypoint. In: Proceedings of IEEE Conference on Computer Vision and Pattern Recognition, pp. 510–517 (2012)
Wang, Z., Fan, B., Wu, F.: Local intensity order pattern for feature description. In: Proceedings of IEEE International Conference on Computer Vision, pp. 603–610 (2011)
Miksik, O., Mikolajczyk, K.: Evaluation of local detectors and descriptors for fast feature matching. In: Proceedings of International Conference on Pattern Recognition, pp. 2681–2684 (2012)
Restrepo, M.I., Mundy, J.L.: An evaluation of local shape descriptors in probabilistic volumetric scenes. In: Proceedings of the British Machine Vision Conference, pp. 46.1–46.11 (2012)
Moreels, P., Perona, P.: Evaluation of features detectors and descriptors based on 3D objects. Int. J. Comput. Vis. 73, 263–284 (2007)
Dahl, A.L., Aanaes, H., Pedersen, K.S.: Finding the best feature detector-descriptor combination. In: Proceedings of International Conference on 3D Imaging, Modeling, Processing, Visualization and Transmission, pp. 318–325 (2011)
Haja, A., Jahne, B., Abraham, S.: Localization accuracy of region detectors. In: Proceedings of IEEE Conference on Computer Vision and Pattern Recognition, pp. 1–8 (2008)
Dickscheid, T., Schindler, F., Forstner, W.: Coding images with local features. Int. J. Comput. Vis. 94, 154–174 (2011)
Canclini, A., Cesana, M., Redondi, A., Tagliasacchi, M., Ascenso, J., Cilla, R.: Evaluation of low-complexity visual feature detectors and descriptors. In: Proceedings of International Conference on Digital Signal Processing, pp. 1–7 (2013)
Salzmann, M., Moreno-Noguer, F., Lepetit, V., Fua, P.: Closed-form solution to non-rigid 3D surface registration. In: Proceedings of European Conference on Computer Vision, pp. 581–594 (2008)
Acknowledgement
This work was supported by the IT R&D program of MSIP/ KEIT. [10047078, 3D reconstruction technology development for scene of car accident using multi view black box image].
Author information
Authors and Affiliations
Corresponding author
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2015 Springer International Publishing Switzerland
About this paper
Cite this paper
Lee, M.H., Park, I.K. (2015). Performance Evaluation of Local Descriptors for Affine Invariant Region Detector. In: Jawahar, C., Shan, S. (eds) Computer Vision - ACCV 2014 Workshops. ACCV 2014. Lecture Notes in Computer Science(), vol 9008. Springer, Cham. https://doi.org/10.1007/978-3-319-16628-5_45
Download citation
DOI: https://doi.org/10.1007/978-3-319-16628-5_45
Published:
Publisher Name: Springer, Cham
Print ISBN: 978-3-319-16627-8
Online ISBN: 978-3-319-16628-5
eBook Packages: Computer ScienceComputer Science (R0)