Abstract
The definition of Value at Risk is quite general. There are many approaches that may lead to various VaR values. Backtesting is a necessary statistical procedure to test VaR models and select the best one. There are a lot of techniques for validating VaR models. Usually risk managers are not concerned about their statistical power. The goal of this paper is to compare statistical power of specific backtest procedures but also to examine the problem of limited data sets (observed in practice). A loss function approach is usually used to rank correct VaR models, but it is also possible to evaluate VaR models by using that approach. This paper presents the idea of loss functions and compares the statistical power of backtests based on a various loss functions with the Kupiec and Berkowitz approach. Simulated data representing asset returns are used here. This paper is a continuation of earlier pieces of research done by the author.
This is a preview of subscription content, log in via an institution.
Buying options
Tax calculation will be finalised at checkout
Purchases are for personal use only
Learn about institutional subscriptionsReferences
Angelidis, T., & Degiannakis, S. (2007). Backtesting VaR models: A two-stage procedure. Journal of Risk Model Validation, 1(2), 27–48.
Blanco, C., & Ihle, G. (1999). How good is your VaR? Using backtesting to assess system performance. Financial Engineering News, August, 1–2.
Campbell, S. (2005). A Review of Backtesting and Backtesting Procedures. Federal Reserve Board, Washington.
Haas, M. (2001). New methods in backtesting. Working paper. Financial Engineering Research Center Caesar, Friedensplatz, Bonn.
Jorion, P. (2007). Value at risk (3rd ed.). New York: McGraw-Hill.
Lopez, J. (1998). Methods for Evaluating Value-at-Risk Estimates. Federal Reserve Bank of New York Research Paper no. 9802.
Piontek, K. (2010). The analysis of power for some chosen VaR backtesting procedures: Simulation approach. In Studies in classification, data analysis, and knowledge organization (pp. 481–490). New York: Springer.
Author information
Authors and Affiliations
Corresponding author
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2014 Springer International Publishing Switzerland
About this paper
Cite this paper
Piontek, K. (2014). Value-at-Risk Backtesting Procedures Based on Loss Functions: Simulation Analysis of the Power of Tests. In: Spiliopoulou, M., Schmidt-Thieme, L., Janning, R. (eds) Data Analysis, Machine Learning and Knowledge Discovery. Studies in Classification, Data Analysis, and Knowledge Organization. Springer, Cham. https://doi.org/10.1007/978-3-319-01595-8_30
Download citation
DOI: https://doi.org/10.1007/978-3-319-01595-8_30
Published:
Publisher Name: Springer, Cham
Print ISBN: 978-3-319-01594-1
Online ISBN: 978-3-319-01595-8
eBook Packages: Mathematics and StatisticsMathematics and Statistics (R0)