Abstract
The purpose of this paper is to describe an integrated model for assessing the performance of a given ultrasonic inspection system for detecting internal flaws, where the performance of such a system is measured by probability of detection and other related quantities. The integrated model incorporates much of the work described in Thompson (1982), Gray and Thompson (1982), Thompson and Gray (1982), Addison and Elsley (1982), and Tittmann and Ahlberg (1982), The major challenges to these investigators were to properly account for the effects of real part geometries on sound propagation and to measure noise spectra due to various noise mechanisms. The results of these efforts could be incorporated into a model which computes a signal-to-noise ratio for any given transducer configuration and flaw state. The choice of an optimal transducer configuration might then be guided by such calculations.
This is a preview of subscription content, log in via an institution to check access.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
Addison, R.C. and R.K. Elsley (1982), “Flaw Detection below Curved Surfaces of Components,” Review of Progress in Quantitative NDE, Vol. 2, Plenum Publishing Corp., New York.
Gray, T.A. and R.B. Thompson (1982), “Ultrasonic Flaw Detection in Turbine Rotor Component Web Geometries,” Review of Progress in Quantitative NDE, Vol. 2, Plenum Publishing Corp., New York.
Thompson, R.B., (1982), “Diffraction Corrections for Scattering Measurements,” Internal Report, Center for Advanced Nondestructive Evaluation, Ames Laboratory, Iowa State University.
Thompson, R.B. and T.A. Gray, (1982), “Analytical Diffraction Corrections in Ultrasonic Scattering Measurements,” Review of Progress in Quantitative NDE, Vol. 2, Plenum Publishing Corp., New York.
Tittmann, B.R. and L.A. Ahlberg, (1982), “Attenuation and Grain Noise Parameters,” Review of Progress in Quantitative NDE, Vol. 2, Plenum Publishing Corp., New York.
Yariv, A., (1971), Introduction to Optical Electronics, Holt, Rinehart and Winston, Inc., New York.
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 1983 Plenum Press, New York
About this chapter
Cite this chapter
Fertig, K.W., Richardson, J.M. (1983). Computer Simulation of Probability of Detection. In: Thompson, D.O., Chimenti, D.E. (eds) Review of Progress in Quantitative Nondestructive Evaluation. Library of Congress Cataloging in Publication Data, vol 2A. Springer, Boston, MA. https://doi.org/10.1007/978-1-4613-3706-5_9
Download citation
DOI: https://doi.org/10.1007/978-1-4613-3706-5_9
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4613-3708-9
Online ISBN: 978-1-4613-3706-5
eBook Packages: Springer Book Archive