In the last decade, since the publication of the first edition of Scanning Electron Microscopy and X-ray Microanalysis, there has been a great expansion in the capabilities of the basic SEM and EPMA. High resolution imaging has been developed with the aid of an extensive range of field emission gun (FEG) microscopes. The magnification ranges of these instruments now overlap those of the transmission electron microscope. Low-voltage microscopy using the FEG now allows for the observation of noncoated samples. In addition, advances in the develop ment of x-ray wavelength and energy dispersive spectrometers allow for the measurement of low-energy x-rays, particularly from the light elements (B, C, N, 0). In the area of x-ray microanalysis, great advances have been made, particularly with the "phi rho z" [Ij)(pz)] technique for solid samples, and with other quantitation methods for thin films, particles, rough surfaces, and the light elements. In addition, x-ray imaging has advanced from the conventional technique of "dot mapping" to the method of quantitative compositional imaging. Beyond this, new software has allowed the development of much more meaningful displays for both imaging and quantitative analysis results and the capability for integrating the data to obtain specific information such as precipitate size, chemical analysis in designated areas or along specific directions, and local chemical inhomogeneities.
Reviews
From a review of the first edition: `The emphasis throughout has been on practical aspects ... that approach, plus the comprehensiveness of the material covered, makes this a valuable, virtually indispensible, reference work.' Microscope Journal
Authors and Affiliations
Lehigh University, Bethlehem, USA
Joseph I. Goldstein,
Charles E. Lyman
National Institute of Standards and Technology, Gaithersburg, USA
Dale E. Newbury,
Charles Fiori
University of Cambridge, Cambridge, England
Patrick Echlin
University of Tennessee, Knoxville, USA
David C. Joy
Sandia National Laboratories, Albuquerque, USA
A. D. Romig
General Electric Corporate Research and Development, Schenectady, USA
Eric Lifshin
Bibliographic Information
Book Title: Scanning Electron Microscopy and X-Ray Microanalysis
Book Subtitle: A Text for Biologists, Materials Scientists, and Geologists
Authors: Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, A. D. Romig, Charles E. Lyman, Charles Fiori, … Eric Lifshin
