Abstract
This chapter will set the stage for our discussion of imaging using diffraction contrast. Put simply, diffraction contrast arises because the intensity of the diffr3acted beams is different in different regions of the specimen. These variations may arise because of changing diffracting conditions or because of differences in specimen thickness. In our study of diffraction in the TEM, we will see spots—lots of them. Sometimes the ‘spots’ will be small faint points and other times they will be large disks, which themselves contain ‘structure’ and more information. Other patterns will contain lines that we will examine in Chapters 19–21.
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Diffraction and Optics
Bragg, WL 1965 The Crystalline State I Ed. WL Bragg Cornell University Press Ithaca NY (first published in 1933). Find it in your library and browse.
Hecht, E 2001 Optics 4th Ed. Addison-Wesley Reading MA. Very readable and current.
James, RW 1965 The Optical Principles of the Diffraction of X-Rays, The Crystalline State II Ed. WL Bragg Ed. Cornell University Press Ithaca NY (first published in 1948). Ditto.
Schwartz, LH and Cohen, JB 1987 Diffraction from Materials 2nd Ed. Springer New York. One of the two standard texts.
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Williams, D.B., Carter, C.B. (2009). Diffraction in TEM. In: Transmission Electron Microscopy. Springer, Boston, MA. https://doi.org/10.1007/978-0-387-76501-3_11
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DOI: https://doi.org/10.1007/978-0-387-76501-3_11
Publisher Name: Springer, Boston, MA
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