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On-line testing of an off-the-shelf microprocessor board for safety-critical applications

  • Session 4 Fault Tolerant Design
  • Conference paper
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Part of the book series: Lecture Notes in Computer Science ((LNCS,volume 1150))

Abstract

The paper describes the strategy adopted to implement on-line test procedures for a commercial microprocessor board used in an automated light-metro control system. Special care has been devoted to chose the most effective test strategy for memory elements, processors, and caches, while guaranteeing a minimum impact on the normal behavior of the whole system. Implementation of the described techniques will significantly improve the system ability to safely react to possible faults. This will be quantitatively determined in the subsequent dependability evaluation phase.

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References

  1. P.H. Bardell, W.H. McAnney, J. Savir: Built-in Test for VLSI, John Wiley & Sons, 1987

    Google Scholar 

  2. D. Brahme, J.A. Abraham: Functional Testing of Microprocessors, IEEE Trans. on Computers, Vol. C-33, June 1984, pp. 475–485

    Google Scholar 

  3. P.M. Carter, B.R. Wilkins: Influences on Soft Error Rates in Static RAM's, IEEE Journal of Solid-State Circuits, Vol. SC-22, No. 3, June 1987

    Google Scholar 

  4. J.A. Clark, D.K. Pradhan: Fault Injection: A Method for Validating Computer-System Dependability, IEEE Computer, June 1995, pp. 47–56

    Google Scholar 

  5. P. Camurati, P. Prinetto, M. Sonza Reorda, S. Barbagallo, A. Burri, D. Medina: Industrial BIST of embedded RAMS, IEEE Design and Test, Fall 1995, pp. 86–95

    Google Scholar 

  6. K. Godfrey, G. Lawton, MC68302 Confidence Test Software, AN469/D, Motorola Semiconductor Application Note, 1993

    Google Scholar 

  7. A.J. van de Goor: Testing Semiconductor Memories: Theory and Practice, John Wiley and Sons, 1991

    Google Scholar 

  8. GreenSpring Computers, IP-COMM302 User Manual, Menlo Park, CA (USA), 1994

    Google Scholar 

  9. IEEE, IEEE standard VHDL language reference manual, IEEE Computer Science Series, March 1988

    Google Scholar 

  10. G. Mongardi, Dependable Computing for Railway Control Systems, DCCA-3 Conf., Palermo (Italy), 1992

    Google Scholar 

  11. Motorola Inc., MVME162 Embedded Controller User's Manual — MVME162/D1, 1994

    Google Scholar 

  12. Motorola Inc., MVME162 Embedded Controller Programmer's Reference Manual — MVME162PG, 1994

    Google Scholar 

  13. Motorola Inc.: 162Bug™ Debugging Package User's Manual — MVME162BUG/D1A2, 1994

    Google Scholar 

  14. Motorola Inc.: Microprocessor and Memory Technology Group, Reliability and Quality Report, BR1100/D, Rev. 14

    Google Scholar 

  15. M. Nicolaidis: Transparent BIST for RAMS, Proc. Int. Test Conf., 1992, pp. 598–607

    Google Scholar 

  16. R. Nair, S.M. Thatte, J.A. Abraham: Efficient algorithms for testing semiconductors random access memories, IEEE Trans. on Computers, Vol. C-27, June 1978, pp. 572–576

    Google Scholar 

  17. J. Sosnowski: In system testing of cache memories, IEEE Int. Test Conf., 1995, pp. 384–393

    Google Scholar 

  18. A.J. van de Goor, T.J.W. Verhallen: Functional Testing of Current Microprocessors (applied to the Intel i860™), IEEE Int. Test Conf., 1992, pp. 684–695

    Google Scholar 

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Authors

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Andrzej Hlawiczka João Gabriel Silva Luca Simoncini

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© 1996 Springer-Verlag Berlin Heidelberg

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Corno, F. et al. (1996). On-line testing of an off-the-shelf microprocessor board for safety-critical applications. In: Hlawiczka, A., Silva, J.G., Simoncini, L. (eds) Dependable Computing — EDCC-2. EDCC 1996. Lecture Notes in Computer Science, vol 1150. Springer, Berlin, Heidelberg. https://doi.org/10.1007/3-540-61772-8_38

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  • DOI: https://doi.org/10.1007/3-540-61772-8_38

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  • Publisher Name: Springer, Berlin, Heidelberg

  • Print ISBN: 978-3-540-61772-3

  • Online ISBN: 978-3-540-70677-9

  • eBook Packages: Springer Book Archive

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